Wafer thin testing?
Wafer thin testing?
Submitted by /* Rambling comments... */ on Mon, 26/04/2004 - 23:51.I've spent the past month or so helping a corporate client improve code quality in a sprawling application. It's non-trivial, the code-base is huge, the quality is, at best, questionable and the coupling is excessive and made worse by the fact that much of the system is coupled together using a single huge blob of relatively unstructured XML. Fun, fun, fun...
